Electronic Structure of Semiconductor Nanocrystals
Chin. J. Semicond. 2006, 27(2): 191
Chin. J. Semicond. 2006, 27(2): 197
Chin. J. Semicond. 2006, 27(2): 204
Quantum Measurement of Single Electron State by a Mesoscopic Detector
Chin. J. Semicond. 2006, 27(2): 218
Study of NiSi/Si Interface by Cross-Section Transmission Electron Microscopy
Chin. J. Semicond. 2006, 27(2): 223
Chin. J. Semicond. 2006, 27(2): 229
Chin. J. Semicond. 2006, 27(2): 235
Effect of Lattice Mismatch on Luminescence of ZnO/Si Hetero-Structure
Chin. J. Semicond. 2006, 27(2): 239
Chin. J. Semicond. 2006, 27(2): 245
Fabrication and Emission Properties of a n-ZnO/p-GaN Heterojunction Light-Emitting Diode
Chin. J. Semicond. 2006, 27(2): 249
Chin. J. Semicond. 2006, 27(2): 254
Fine-Grain Sleep Transistor Insertion for Leakage Reduction
Chin. J. Semicond. 2006, 27(2): 258
S-Band 1mm SiC MESFET with 2W Output on Semi-Insulated SiC Substrate
Chin. J. Semicond. 2006, 27(2): 266
High Power SiGe X-Band (8~10GHz) Heterojunction Bipolar Transistors and Amplifiers
Chin. J. Semicond. 2006, 27(2): 270
Numerical Explanation of Slow Transients in an AlGaN/GaN HEMT
Chin. J. Semicond. 2006, 27(2): 276
Study of Electron Mobility in 4H-SiC Buried-Channel MOSFETs
Chin. J. Semicond. 2006, 27(2): 283
Chin. J. Semicond. 2006, 27(2): 290
Chin. J. Semicond. 2006, 27(2): 294
Two-Dimensional Static Numerical Modeling and Simulation of AlGaN/GaN HEMT
Chin. J. Semicond. 2006, 27(2): 298
Chin. J. Semicond. 2006, 27(2): 304
Fabrication and Numerical Simulation of a Micromachined Contact Cantilever RF-MEMS Switch
Chin. J. Semicond. 2006, 27(2): 309
A New CMOS Image Sensor with a High Fill Factor and the Dynamic Digital Double Sampling Technique
Chin. J. Semicond. 2006, 27(2): 313
A Low Power SRAM/SOI Memory Cell Design
Chin. J. Semicond. 2006, 27(2): 318
Monolithically Integrated Optoelectronic Receivers Implemented in 0.25μm MS/RF CMOS
Chin. J. Semicond. 2006, 27(2): 323
Tapered Multimode Interference Combiners for Coherent Receivers
Chin. J. Semicond. 2006, 27(2): 328
Growth of ZnO Single Crystal by Chemical Vapor Transport Method
Chin. J. Semicond. 2006, 27(2): 336
Characteristics of Annealing of InN Films
Chin. J. Semicond. 2006, 27(2): 340
Photoluminescence and Application of Nonlinear Optical Property of nc-Si-SiO2 Films
Chin. J. Semicond. 2006, 27(2): 345
Study of Thermal Characteristics of Semiconductor Light-Emitting Devices
Chin. J. Semicond. 2006, 27(2): 350
Chin. J. Semicond. 2006, 27(2): 354
Research on CMOS Compatible Integrated Humidity Sensors
Chin. J. Semicond. 2006, 27(2): 358
Chin. J. Semicond. 2006, 27(2): 363
A Novel Triplexer Design Based on Arrayed Waveguide Grating
Chin. J. Semicond. 2006, 27(2): 368
Characterization and Modeling for 0.13μm RF MOSFETs
Chin. J. Semicond. 2006, 27(2): 373