The oscillations in ESR spectra of Hg0.76Cd0.24Te implanted by Ag+ at the X and Q-bands
J. Semicond. 2018, 39(5): 052001
doi: 10.1088/1674-4926/39/5/052001
J. Semicond. 2018, 39(5): 053001
doi: 10.1088/1674-4926/39/5/053001
The structure and magnetic properties of β-(Ga0.96Mn0.04)2O3 thin film
J. Semicond. 2018, 39(5): 053002
doi: 10.1088/1674-4926/39/5/053002
Lateral polarity control of III-nitride thin film and application in GaN Schottky barrier diode
J. Semicond. 2018, 39(5): 053003
doi: 10.1088/1674-4926/39/5/053003
Growth and characteristics of p-type doped GaAs nanowire
J. Semicond. 2018, 39(5): 053004
doi: 10.1088/1674-4926/39/5/053004
J. Semicond. 2018, 39(5): 054001
doi: 10.1088/1674-4926/39/5/054001
Self-assembled patches in PtSi/n-Si (111) diodes
J. Semicond. 2018, 39(5): 054002
doi: 10.1088/1674-4926/39/5/054002
An improved large signal model of InP HEMTs
J. Semicond. 2018, 39(5): 054003
doi: 10.1088/1674-4926/39/5/054003
An investigation of the DC and RF performance of InP DHBTs transferred to RF CMOS wafer substrate
J. Semicond. 2018, 39(5): 054004
doi: 10.1088/1674-4926/39/5/054004
Asymmetric anode and cathode extraction structure fast recovery diode
J. Semicond. 2018, 39(5): 054005
doi: 10.1088/1674-4926/39/5/054005
Frequency equation for the submicron CMOS ring oscillator using the first order characterization
J. Semicond. 2018, 39(5): 055001
doi: 10.1088/1674-4926/39/5/055001
Design and implementation of quadrature bandpass sigma–delta modulator used in low-IF RF receiver
J. Semicond. 2018, 39(5): 055002
doi: 10.1088/1674-4926/39/5/055002
An advanced SEU tolerant latch based on error detection
J. Semicond. 2018, 39(5): 055003
doi: 10.1088/1674-4926/39/5/055003