Design and implementation of 83-nm low noise InP-based InAlAs/InGaAs PHEMTs
Zhiming Wang,
Zhuobin Zhao,
Zhifu Hu,
Hui Huang,
Yuxing Cui,
Xiguo Sun,
Jianghui Mo,
Liang Li,
Xingchang Fu,
Xin Lü
doi: 10.1088/1674-4926/36/8/084002
key words:
InP,
PHEMT,
millimeter wave,
low noise,
on-wafer measurement