Multivariate rational regression and its application in semiconductor device modeling

Yuxi Hong, Dongsheng Ma, Zuochang Ye

doi: 10.1088/1674-4926/39/9/094010

key words: multivariate rational regression, MRR, semiconductor device modeling, vector fitting

Statistically modeling I-V characteristics of CNT-FET with LASSO

Dongsheng Ma, Zuochang Ye, Yan Wang

doi: 10.1088/1674-4926/38/8/084002

key words: statistical learning, compact model, CNT-FET, I-V characteristics, LASSO, machine learning