A revew of in situ transmission electron microscopy study on the switching mechanism and packaging reliability in non-volatile memory
Xin Yang,
Chen Luo,
Xiyue Tian,
Fang Liang,
Yin Xia,
Xinqian Chen,
Chaolun Wang,
Steve Xin Liang,
Xing Wu,
Junhao Chu
doi: 10.1088/1674-4926/42/1/013102
key words:
memory,
transmission electron microscopy,
in situ characterization,
package,
reliability
