A revew of in situ transmission electron microscopy study on the switching mechanism and packaging reliability in non-volatile memory

Xin Yang, Chen Luo, Xiyue Tian, Fang Liang, Yin Xia, Xinqian Chen, Chaolun Wang, Steve Xin Liang, Xing Wu, Junhao Chu

doi: 10.1088/1674-4926/42/1/013102

key words: memory, transmission electron microscopy, in situ characterization, package, reliability

Substrates and interlayer coupling effects on Mo_1−xW_xSe₂ alloys

Fang Liang, Hejun Xu, Zuoyuan Dong, Yafeng Xie, Chen Luo, Yin Xia, Jian Zhang, Jun Wang, Xing Wu

doi: 10.1088/1674-4926/40/6/062005

key words: Mo_1−xW_xSe₂, substrates, two-dimensional materials, bandgaps, photoluminescence