SEMICONDUCTOR INTEGRATED CIRCUITS

Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator

Ge Binjie, Wang Xin’an, Zhang Xing, Feng Xiaoxing and Wang Qingqin

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Abstract: The quantization noise leakage of the first stage in a MASH21 sigma–delta modulator is analyzed. The results show that the finite DC gain of the opamp is the main reason for noise leakage, and finite GBW and SR only generate harmonic distortion. The relationship between DC gain and leakage is modeled and conclusions on design criteria are reached. As an example, a MASH21 modulator for a digital audio application is realized. This modulator, fabricated in an 0.18 μm mixed signal process, achieves an SNDR of 91 dB with 1.8 V supply, which verifies the analysis and design criteria.

Key words: mismatch

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    Received: 18 August 2015 Revised: 08 September 2009 Online: Published: 01 January 2010

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      Ge Binjie, Wang Xin’an, Zhang Xing, Feng Xiaoxing, Wang Qingqin. Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator[J]. Journal of Semiconductors, 2010, 31(1): 015007. doi: 10.1088/1674-4926/31/1/015007 Ge B J, Wang X A, Zhang X, Feng X X, Wang Q Q. Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator[J]. J. Semicond., 2010, 31(1): 015007. doi:  10.1088/1674-4926/31/1/015007.Export: BibTex EndNote
      Citation:
      Ge Binjie, Wang Xin’an, Zhang Xing, Feng Xiaoxing, Wang Qingqin. Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator[J]. Journal of Semiconductors, 2010, 31(1): 015007. doi: 10.1088/1674-4926/31/1/015007

      Ge B J, Wang X A, Zhang X, Feng X X, Wang Q Q. Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator[J]. J. Semicond., 2010, 31(1): 015007. doi:  10.1088/1674-4926/31/1/015007.
      Export: BibTex EndNote

      Study and analysis of coefficient mismatch in a MASH21 sigma–delta modulator

      doi: 10.1088/1674-4926/31/1/015007
      • Received Date: 2015-08-18
      • Accepted Date: 2009-06-11
      • Revised Date: 2009-09-08
      • Published Date: 2009-12-29

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