SEMICONDUCTOR MATERIALS

A novel compensation method for polygonized mesa structures on (100) silicon substrate

Zhang Han and Li Weihua

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Abstract: A theoretical compensation method for polygonized mesa structures on (100) silicon substrate during the anisotropic etching process has been developed, which contains four stages as follows: prepare the information of the etching condition; predict the structure’s undercutting profile; construct the topological structure of compensation patterns; and generate practical compensation patterns from the topological structure. The reasoning process is clearly stated, and detailed steps for the undercutting prediction and topological structure construction are summarized. Conclusions are also drawn about the rules which must be obeyed during the pattern generation process. The simulation and experimental results of some polygon structures are finally given to prove this method’s validity and reliability.

Key words: (100) substrate

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    Received: 18 August 2015 Revised: 15 January 2010 Online: Published: 01 June 2010

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      Zhang Han, Li Weihua. A novel compensation method for polygonized mesa structures on (100) silicon substrate[J]. Journal of Semiconductors, 2010, 31(6): 063002. doi: 10.1088/1674-4926/31/6/063002 Zhang H, Li W H. A novel compensation method for polygonized mesa structures on (100) silicon substrate[J]. J. Semicond., 2010, 31(6): 063002. doi: 10.1088/1674-4926/31/6/063002.Export: BibTex EndNote
      Citation:
      Zhang Han, Li Weihua. A novel compensation method for polygonized mesa structures on (100) silicon substrate[J]. Journal of Semiconductors, 2010, 31(6): 063002. doi: 10.1088/1674-4926/31/6/063002

      Zhang H, Li W H. A novel compensation method for polygonized mesa structures on (100) silicon substrate[J]. J. Semicond., 2010, 31(6): 063002. doi: 10.1088/1674-4926/31/6/063002.
      Export: BibTex EndNote

      A novel compensation method for polygonized mesa structures on (100) silicon substrate

      doi: 10.1088/1674-4926/31/6/063002
      • Received Date: 2015-08-18
      • Accepted Date: 2009-06-22
      • Revised Date: 2010-01-15
      • Published Date: 2010-06-03

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