SEMICONDUCTOR INTEGRATED CIRCUITS

An embeddable SOC real-time prediction technology for TDDB

Xin Weiping, Zhuang Yiqi and Li Xiaoming

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Abstract: This paper presents an embeddable SOC real-time prediction circuit and method for TDDB. When the SOC under test is fails due to TDDB, the prediction circuit is capable of issuing a warning signal. The prediction circuit, designed by using a standard CMOS process, occupies a small silicon area and does not share any signal with the circuits under test, therefore, the possibility of interference with the surrounding circuits is safely excluded.

Key words: TDDBreal-timereliabilitypredictionSOC

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    Received: 20 August 2015 Revised: 06 June 2012 Online: Published: 01 November 2012

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      Xin Weiping, Zhuang Yiqi, Li Xiaoming. An embeddable SOC real-time prediction technology for TDDB[J]. Journal of Semiconductors, 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009 Xin W P, Zhuang Y Q, Li X M. An embeddable SOC real-time prediction technology for TDDB[J]. J. Semicond., 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009.Export: BibTex EndNote
      Citation:
      Xin Weiping, Zhuang Yiqi, Li Xiaoming. An embeddable SOC real-time prediction technology for TDDB[J]. Journal of Semiconductors, 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009

      Xin W P, Zhuang Y Q, Li X M. An embeddable SOC real-time prediction technology for TDDB[J]. J. Semicond., 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009.
      Export: BibTex EndNote

      An embeddable SOC real-time prediction technology for TDDB

      doi: 10.1088/1674-4926/33/11/115009
      Funds:

      The National Natural Science Foundation of China (General Program, Key Program, Major Research Plan)

      • Received Date: 2015-08-20
      • Accepted Date: 2012-03-29
      • Revised Date: 2012-06-06
      • Published Date: 2012-10-23

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