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To carry out in-depth basic research by taking the leap-forward development opportunities — analysis of the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation of China

He Jie and Pan Qing

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Abstract: 首先强调了2012 年国家自然科学基金的一些新变化,如面上项目平均资助强度将会继续提升至80万元/4 年、新增了优秀青年科学基金以及在当年结题的青年科学基金项目中择优遴选5% 给予面上项目连续资助。然后倡导大家关注器件制备和基础工艺中的关键科学问题,力争将基础研究工作做扎实做深入。最后分析介绍了2011 年半导体科学和信息器件学科组面上、青年、地区和重点基金申请与资助概况,供大家参考。

Key words: 自然科学基金半导体科学项目申请

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    Received: 18 August 2015 Revised: Online: Published: 01 February 2012

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      He Jie, Pan Qing. To carry out in-depth basic research by taking the leap-forward development opportunities — analysisof the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation ofChina[J]. Journal of Semiconductors, 2012, 33(2): 027001. doi: 10.1088/1674-4926/33/2/027001 He J, Pan Q. To carry out in-depth basic research by taking the leap-forward development opportunities — analysisof the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation ofChina[J]. J. Semicond., 2012, 33(2): 027001. doi: 10.1088/1674-4926/33/2/027001.Export: BibTex EndNote
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      He Jie, Pan Qing. To carry out in-depth basic research by taking the leap-forward development opportunities — analysis of the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation of China[J]. Journal of Semiconductors, 2012, 33(2): 027001. doi: 10.1088/1674-4926/33/2/027001

      He J, Pan Q. To carry out in-depth basic research by taking the leap-forward development opportunities — analysisof the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation ofChina[J]. J. Semicond., 2012, 33(2): 027001. doi: 10.1088/1674-4926/33/2/027001.
      Export: BibTex EndNote

      To carry out in-depth basic research by taking the leap-forward development opportunities — analysis of the applied projects in 2011 semiconductor discipline of the National Natural Science Foundation of China

      doi: 10.1088/1674-4926/33/2/027001
      • Received Date: 2015-08-18
      • Published Date: 2012-01-20

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