SEMICONDUCTOR INTEGRATED CIRCUITS

A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC

Shubin Liu, Zhangming Zhu, Yintang Yang and Lianxi Liu

+ Author Affiliations

 Corresponding author: Zhu Zhangming, Email:zhangmingzhu@xidian.edu.cn

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Abstract: A novel fully differential high speed high resolution low offset CMOS dynamic comparator has been implemented in the SMIC 0.18 μm process used for a sample-and-hold amplifier (SHA)-less pipelined analog-to-digital converters (ADC). Based on the analysis and optimization between delay time and offset, an enhanced reset architecture with transmission gate was introduced to speed up the comparison and reset procedure. Four inputs with two cross coupled differential pairs, reconstituted bias circuit for tail current transistor and common centroid layouts make the comparator more robust against mismatch and process variations. The simulation results demonstrate that the proposed design achieves 1 mV sensitivity at 2.2 GHz sampling rate with a power consumption of 510 μW, while the mean offset voltage is equal to 10.244 mV.

Key words: SHA-less ADCdynamic comparatorhigh speedlow offsetlow powertransmission gate



[1]
Li Z. A high-speed comparator for a 12-bit 100 MS/s pipelined ADC. International Conference on Intelligent Computation Technology and Automation (ICICTA), Huhehaote, China, 2011:27
[2]
Khosrov D S. A new offset cancelled latch comparator for high-speed, low-power ADCs, APCCAS. IEEE Asia Pacific Conference on Circuits and Systems, Kuala Lumpur, Malaysia, 2010
[3]
Ye X, Ytterdal T. A low-offset dynamic comparator using bulk biasing technique in digital 65 nm CMOS technology. 10th IEEE International Conference on Solid-State and Integrated Circuit, ICSICT, Shanghai, China, 2010
[4]
Solis C J, Ducoudray G O. High resolution low power 0.6μm CMOS 40 MHz dynamic latch comparator. 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Washington, USA, 2010:1045 https://www.mendeley.com/research-papers/high-resolution-low-power-06m-cmos-40mhz-dynamic-latch-comparator/
[5]
Yu L, Doris K, Hegt H, et al. A dynamic latched comparator for low supply voltages down to 0.45 V in 65-nm COMS. IEEE International Symposium on Circuits and Systems (ISCAS), 2012:2737 https://www.narcis.nl/publication/RecordID/oai%3Alibrary.tue.nl%3A732087
[6]
Moni D J, Jisha P. High-speed and low-power dynamic latch comparator. International Conference on Devices, Circuits and Systems (ICDCS), 2012:259 http://www.ijera.com/papers/Vol2_issue3/HS2313011312.pdf
[7]
Jeon H J, Kim Y B. A novel low-power, low-offset, and highspeed CMOS dynamic latched comparator. Analog Integr Circ Sig Process, 2011, 70:337 doi: 10.1007/s10470-011-9687-5
[8]
Murmann B, Nikaeen P, Connelly D J, et al. Impact of scaling on analog performance and associated modeling needs. IEEE Trans Electron Devices, 2006, 53:2160 doi: 10.1109/TED.2006.880372
[9]
Lin T, Wang M S, Gu W R, et al. A wide-range and high-precision real-time calibration for dynamic comparator. IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012:1 https://www.date-conference.com/date16/_create_app_xml
[10]
Sumanen L, Waltari M, Halonen K. A mismatch insensitive CMOS dynamic comparator for pipeline A/D converters. IEEE International Conference on Electronics, Circuits and Systems (IECS), 2000, 1:32 http://www.ijritcc.org/IJRITCC%20Vol_2%20Issue_5/Design%20of%20a%20CMOS%20Comparator.pdf
[11]
Cho T B, Gray P R. A 10 b, 20 Msample/s, 35 mW pipeline A/D converter. IEEE J Solid-State Circuits, 1995, SC-30:166 http://citeseerx.ist.psu.edu/showciting?cid=2631868
[12]
Johns D, Martin K. Analog integrated circuit design. New York: Wiley, 2000
[13]
Wicht B, Nirschl T, Schmitt-Landsiedel D. Yield and speed optimization of a latch-type voltage sense amplifier. IEEE J Solid-State Circuits, 2004, 39:1148 doi: 10.1109/JSSC.2004.829399
[14]
He J, Zhan S, Chen D, et al. Analyses of static and dynamic random offset voltages in dynamic comparators. IEEE International Symposium on Circuits and Systems, 2009, 56:911 http://class.ece.iastate.edu/vlsi2/docs/Papers%20Done/2009-05-TCAS1-JH.pdf
[15]
Nikoozadeh A, Murmann B. An analysis of latch comparator offset due to load capacitor mismatch. IEEE Trans Circuits Syst Ⅱ:Express Briefs, 2006, 53:1398 doi: 10.1109/TCSII.2006.883204
[16]
Bichan M, Carusone A C. The effect of redundancy on mismatch-induced offset and random noise in a dynamic comparator. Research in Microelectronics and Electronics, 2009:180 http://ieeexplore.ieee.org/document/5201314/
[17]
Kinget P R. Device mismatch and tradeoffs in the design of analog circuits. IEEE J Solid-State Circuits, 2005, 40:1212 doi: 10.1109/JSSC.2005.848021
[18]
Savengsveksa V, Heedley P L, Matthews T, et al. An 8-b 20 Msample/s pipelined A/D converter in 0.5μm CMOS with 7.8 ENOB. IEEE MWSCAS, 2005:409 https://es.scribd.com/document/90619371/Digital-and-Analogue-Instrumentation-Testing-and-Measurement-Electrical-Measurement
[19]
Kim J, Leibowitz B, Ren J, et al. Simulation and analysis of random decision errors in clocked comparators. IEEE Trans Circuits Syst I, Reg Papers, 2009, 56:1844 doi: 10.1109/TCSI.2009.2028449
Fig. 1.  The structure of SHA-less ADC.

Fig. 2.  Conventional comparator.

Fig. 3.  The proposed comparator.

Fig. 4.  Optimum dimension for latch transistors. (a) Delay time versus channel length. (b) Offset voltage versus $W/L$.

Fig. 5.  Common centroid layout for the proposed circuits.

Fig. 6.  Model of two cross coupled differential pairs input.

Fig. 7.  Clock of tail current.

Fig. 8.  Transient simulation result.

Fig. 9.  The amelioration of the reset time due to transistor Mreset1 and Mreset2.

Fig. 10.  Monte-Carlo histogram of offset voltage.

Fig. 11.  The layout of the comparator.

Table 1.   Delay time versus differential voltage.

Table 2.   Power consumption versus work frequency.

Table 3.   The comparison of performance of the varied architectures.

Table 4.   The comparison of this design with its counterparts.

[1]
Li Z. A high-speed comparator for a 12-bit 100 MS/s pipelined ADC. International Conference on Intelligent Computation Technology and Automation (ICICTA), Huhehaote, China, 2011:27
[2]
Khosrov D S. A new offset cancelled latch comparator for high-speed, low-power ADCs, APCCAS. IEEE Asia Pacific Conference on Circuits and Systems, Kuala Lumpur, Malaysia, 2010
[3]
Ye X, Ytterdal T. A low-offset dynamic comparator using bulk biasing technique in digital 65 nm CMOS technology. 10th IEEE International Conference on Solid-State and Integrated Circuit, ICSICT, Shanghai, China, 2010
[4]
Solis C J, Ducoudray G O. High resolution low power 0.6μm CMOS 40 MHz dynamic latch comparator. 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Washington, USA, 2010:1045 https://www.mendeley.com/research-papers/high-resolution-low-power-06m-cmos-40mhz-dynamic-latch-comparator/
[5]
Yu L, Doris K, Hegt H, et al. A dynamic latched comparator for low supply voltages down to 0.45 V in 65-nm COMS. IEEE International Symposium on Circuits and Systems (ISCAS), 2012:2737 https://www.narcis.nl/publication/RecordID/oai%3Alibrary.tue.nl%3A732087
[6]
Moni D J, Jisha P. High-speed and low-power dynamic latch comparator. International Conference on Devices, Circuits and Systems (ICDCS), 2012:259 http://www.ijera.com/papers/Vol2_issue3/HS2313011312.pdf
[7]
Jeon H J, Kim Y B. A novel low-power, low-offset, and highspeed CMOS dynamic latched comparator. Analog Integr Circ Sig Process, 2011, 70:337 doi: 10.1007/s10470-011-9687-5
[8]
Murmann B, Nikaeen P, Connelly D J, et al. Impact of scaling on analog performance and associated modeling needs. IEEE Trans Electron Devices, 2006, 53:2160 doi: 10.1109/TED.2006.880372
[9]
Lin T, Wang M S, Gu W R, et al. A wide-range and high-precision real-time calibration for dynamic comparator. IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012:1 https://www.date-conference.com/date16/_create_app_xml
[10]
Sumanen L, Waltari M, Halonen K. A mismatch insensitive CMOS dynamic comparator for pipeline A/D converters. IEEE International Conference on Electronics, Circuits and Systems (IECS), 2000, 1:32 http://www.ijritcc.org/IJRITCC%20Vol_2%20Issue_5/Design%20of%20a%20CMOS%20Comparator.pdf
[11]
Cho T B, Gray P R. A 10 b, 20 Msample/s, 35 mW pipeline A/D converter. IEEE J Solid-State Circuits, 1995, SC-30:166 http://citeseerx.ist.psu.edu/showciting?cid=2631868
[12]
Johns D, Martin K. Analog integrated circuit design. New York: Wiley, 2000
[13]
Wicht B, Nirschl T, Schmitt-Landsiedel D. Yield and speed optimization of a latch-type voltage sense amplifier. IEEE J Solid-State Circuits, 2004, 39:1148 doi: 10.1109/JSSC.2004.829399
[14]
He J, Zhan S, Chen D, et al. Analyses of static and dynamic random offset voltages in dynamic comparators. IEEE International Symposium on Circuits and Systems, 2009, 56:911 http://class.ece.iastate.edu/vlsi2/docs/Papers%20Done/2009-05-TCAS1-JH.pdf
[15]
Nikoozadeh A, Murmann B. An analysis of latch comparator offset due to load capacitor mismatch. IEEE Trans Circuits Syst Ⅱ:Express Briefs, 2006, 53:1398 doi: 10.1109/TCSII.2006.883204
[16]
Bichan M, Carusone A C. The effect of redundancy on mismatch-induced offset and random noise in a dynamic comparator. Research in Microelectronics and Electronics, 2009:180 http://ieeexplore.ieee.org/document/5201314/
[17]
Kinget P R. Device mismatch and tradeoffs in the design of analog circuits. IEEE J Solid-State Circuits, 2005, 40:1212 doi: 10.1109/JSSC.2005.848021
[18]
Savengsveksa V, Heedley P L, Matthews T, et al. An 8-b 20 Msample/s pipelined A/D converter in 0.5μm CMOS with 7.8 ENOB. IEEE MWSCAS, 2005:409 https://es.scribd.com/document/90619371/Digital-and-Analogue-Instrumentation-Testing-and-Measurement-Electrical-Measurement
[19]
Kim J, Leibowitz B, Ren J, et al. Simulation and analysis of random decision errors in clocked comparators. IEEE Trans Circuits Syst I, Reg Papers, 2009, 56:1844 doi: 10.1109/TCSI.2009.2028449
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    Received: 02 October 2013 Revised: 20 November 2013 Online: Published: 01 May 2014

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      Shubin Liu, Zhangming Zhu, Yintang Yang, Lianxi Liu. A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC[J]. Journal of Semiconductors, 2014, 35(5): 055008. doi: 10.1088/1674-4926/35/5/055008 S B Liu, Z M Zhu, Y T Yang, L X Liu. A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC[J]. J. Semicond., 2014, 35(5): 055008. doi: 10.1088/1674-4926/35/5/055008.Export: BibTex EndNote
      Citation:
      Shubin Liu, Zhangming Zhu, Yintang Yang, Lianxi Liu. A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC[J]. Journal of Semiconductors, 2014, 35(5): 055008. doi: 10.1088/1674-4926/35/5/055008

      S B Liu, Z M Zhu, Y T Yang, L X Liu. A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC[J]. J. Semicond., 2014, 35(5): 055008. doi: 10.1088/1674-4926/35/5/055008.
      Export: BibTex EndNote

      A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC

      doi: 10.1088/1674-4926/35/5/055008
      Funds:

      the National Natural Science Foundation of China 61006028

      the National Natural Science Foundation of China 61234002

      National High-Tech Program of China 2012AA012302

      National High-Tech Program of China 2013AA014103

      Project supported by the National Natural Science Foundation of China (Nos. 61234002, 61006028), the National High-Tech Program of China (Nos. 2012AA012302, 2013AA014103), and the PhD Programs Foundation of Ministry of Education of China (No. 20120203110017)

      the PhD Programs Foundation of Ministry of Education of China 20120203110017

      More Information
      • Corresponding author: Zhu Zhangming, Email:zhangmingzhu@xidian.edu.cn
      • Received Date: 2013-10-02
      • Revised Date: 2013-11-20
      • Published Date: 2014-05-01

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