SEMICONDUCTOR PHYSICS

An analytic model to describe the relationship between conductance and frequency of heterojunction

Changshi Liu

+ Author Affiliations

 Corresponding author: Changshi Liu, E-mail: liucs4976@sohu.com

PDF

Abstract: The admittance measurements of a hetero-junction can be used to derive the density of the interfacial state in the hetero-junction. Hence, prediction conductance via frequency is very useful for comprehension of the admittance of a hetero-junction using a mathematical strategy. From the observations on the curve of the frequency-dependent conductance of the hetero-junction an analytic model with four-parameters was developed that relates conductance to frequency; the theoretical results agree quite well with the experimental data. The model shows potential for a variety of applications including different electronic devices. The model is a practical tool that can be readily used for assessing the electronic behaviors of a hetero-junction and is scientifically justifiable. In addition, the mathematical bridge to link the density of the interfacial state of the (pyronine-B)/p-Si structure to energy implies a good route to discuses the density of the interfacial state of interfaces.

Key words: conductancefrequencypredicthetero-junctiondensity of interfacial state



[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
[15]
[16]
[17]
[18]
[19]
[20]
[21]
[22]
[23]
[24]
[25]
[26]
Fig. 1.  The dependence $\frac{G}{f}$ of Cu(In, Ga)Se$_{2}$ along the frequency is measured[25] and modeled.

Fig. 2.  Comparisons between experimental and calculated frequency dependence of the $\frac{G}{f}$ for GeO$_{x}$N$_{y}$/Ge capacitor[26].

Fig. 3.  The results of model (3) simulation and the measured $\frac{G}{f}$ of the (pyronine-B)/p-Si structure as a function of frequency[24] .

Fig. 4.  Scatter plot of the density of interfacial states of the (pyronine-B)/p-Si structure along with the energy.

DownLoad: CSV
DownLoad: CSV
DownLoad: CSV
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
[15]
[16]
[17]
[18]
[19]
[20]
[21]
[22]
[23]
[24]
[25]
[26]
  • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2181 Times PDF downloads: 46 Times Cited by: 0 Times

    History

    Received: 25 June 2014 Revised: Online: Published: 01 January 2015

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Changshi Liu. An analytic model to describe the relationship between conductance and frequency of heterojunction[J]. Journal of Semiconductors, 2015, 36(1): 012001. doi: 10.1088/1674-4926/36/1/012001 C S Liu. An analytic model to describe the relationship between conductance and frequency of heterojunction[J]. J. Semicond., 2015, 36(1): 012001. doi: 10.1088/1674-4926/36/1/012001.Export: BibTex EndNote
      Citation:
      Changshi Liu. An analytic model to describe the relationship between conductance and frequency of heterojunction[J]. Journal of Semiconductors, 2015, 36(1): 012001. doi: 10.1088/1674-4926/36/1/012001

      C S Liu. An analytic model to describe the relationship between conductance and frequency of heterojunction[J]. J. Semicond., 2015, 36(1): 012001. doi: 10.1088/1674-4926/36/1/012001.
      Export: BibTex EndNote

      An analytic model to describe the relationship between conductance and frequency of heterojunction

      doi: 10.1088/1674-4926/36/1/012001
      More Information
      • Corresponding author: E-mail: liucs4976@sohu.com
      • Received Date: 2014-06-25
      • Accepted Date: 2014-08-04
      • Published Date: 2015-01-25

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return