J. Semicond. > 2015, Volume 36 > Issue 7 > 075005, doi: 10.1088/1674-4926/36/7/075005
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SEMICONDUCTOR INTEGRATED CIRCUITS

Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor

Pengjun Wang, Xuelong Zhang, Yuejun Zhang and Jianrui Li

+ Author Affiliations

 Corresponding author: Pengjun Wang, E-mail: wangpengjun@nbu.edu.cn

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Abstract: A novel physical unclonable functions (PUF) circuit is proposed, which relies on non-linear characteristic of analog voltage generated by R-2R ladder DAC. After amplifying the deviation signal, the robustness of the DAC-PUF circuit has increased significantly. The DAC-PUF circuit is designed in TSMC 65 nm CMOS technology and the layout occupies 86.06 × 63.56 μm2. Monte Carlo simulation results show that the reliability of the DAC-PUF circuit is above 98% over a comprehensive range of environmental variation, such as temperature and supply voltage.

Key words: process variation, digital-to-analog convertor, physical unclonable functions, sense amplifier



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Fig. 1.  Structure of DAC-PUF.

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Fig. 2.  Mismatch statistics of (a) switch transistor and (b) poly-resistor. $\mu $ is mean value, $\sigma $ is standard deviation value.

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Fig. 3.  The circuit of an 8-bit R-2R ladder DAC.

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Fig. 4.  Monte Carlo simulation results of DAC output when (a) challenge is "10000000" and (b) challenge is "11111111".

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Fig. 5.  The layout of DAC-PUF.

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Fig. 6.  Timing of the DAC-PUF.

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Fig. 7.  DAC-PUF reliability under (a) supply voltage variation and (b) temperature variation.

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Table 1.   The comparison of different types of PUFs.

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    Received: 17 November 2014 Revised: Online: Published: 01 July 2015

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      Article Navigation >  Journal of Semiconductors  > 2015  >  36(7): 075005
      Pengjun Wang, Xuelong Zhang, Yuejun Zhang, Jianrui Li. Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor[J]. Journal of Semiconductors, 2015, 36(7): 075005. doi: 10.1088/1674-4926/36/7/075005 P J Wang, X L Zhang, Y J Zhang, J R Li. Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor[J]. J. Semicond., 2015, 36(7): 075005. doi: 10.1088/1674-4926/36/7/075005.Export: BibTex EndNote
      Citation:
      Pengjun Wang, Xuelong Zhang, Yuejun Zhang, Jianrui Li. Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor[J]. Journal of Semiconductors, 2015, 36(7): 075005. doi: 10.1088/1674-4926/36/7/075005

      P J Wang, X L Zhang, Y J Zhang, J R Li. Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor[J]. J. Semicond., 2015, 36(7): 075005. doi: 10.1088/1674-4926/36/7/075005.
      Export: BibTex EndNote
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      Design of a reliable PUF circuit based on R-2R ladder digital-to-analog convertor

      doi: 10.1088/1674-4926/36/7/075005

      • Institute of Circuits and Systems, Ningbo University, Ningbo 315211, China

      Funds:

      Project supported by the National Natural Science Foundation of China (Nos. 61474068, 61404076, 61274132), the Zhejiang Provincial Natural Science Foundation of China (No. LQ14F040001), and the K. C. Wong Magna Fund in Ningbo University, China.

      More Information
      • Corresponding author: E-mail: wangpengjun@nbu.edu.cn
      • Received Date: 2014-11-17
      • Accepted Date: 2015-02-01
      • Published Date: 2015-01-25

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