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Radiation-induced 1/f noise degradation of bipolar linear voltage regulator

Qifeng Zhao1, Yiqi Zhuang1, Junlin Bao1, and Wei Hu2

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 Corresponding author: Bao Junlin, Email:baoing@126.com

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Abstract: Radiation-induced 1/f noise degradation in the LM117 bipolar linear voltage regulator is studied. Based on the radiation-induced degradation mechanism of the output voltage, it is suggested that the band-gap reference subcircuit is the critical component which leads to the 1/f noise degradation of the LM117. The radiation makes the base surface current of the bipolar junction transistors of the band-gap reference subcircuit increase, which leads to an increase in the output 1/f noise of the LM117. Compared to the output voltage, the 1/f noise parameter is more sensitive, it may be used to evaluate the radiation resistance capability of LM117.

Key words: radiationbipolar linear voltage regulator1/f noise degradation



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Fig. 1.  Circuit schematic of the LM117.

Fig. 2.  LM117 band-gap reference regulator circuit.

Fig. 3.  Application and test circuit for LM117.

Fig. 4.  Simplified low frequency noise equivalent circuit of the bipolar transistor is shown inside the dash box.

Fig. 5.  Change of output voltage versus total doses.

Fig. 6.  Output voltage noise spectra during irradiation for various total doses.

Fig. 7.  Change of amplitude of 1/$f$ noise $\Delta B$ as a function of various total doses.

Fig. 8.  Comparison between normalized 1/$f$ noise increment and normalized output voltage increment with total dose.

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    Received: 13 July 2015 Revised: Online: Published: 01 March 2016

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      Qifeng Zhao, Yiqi Zhuang, Junlin Bao, Wei Hu. Radiation-induced 1/f noise degradation of bipolar linear voltage regulator[J]. Journal of Semiconductors, 2016, 37(3): 034004. doi: 10.1088/1674-4926/37/3/034004 Q F Zhao, Y Q Zhuang, J L Bao, W Hu. Radiation-induced 1/f noise degradation of bipolar linear voltage regulator[J]. J. Semicond., 2016, 37(3): 034004. doi: 10.1088/1674-4926/37/3/034004.Export: BibTex EndNote
      Citation:
      Qifeng Zhao, Yiqi Zhuang, Junlin Bao, Wei Hu. Radiation-induced 1/f noise degradation of bipolar linear voltage regulator[J]. Journal of Semiconductors, 2016, 37(3): 034004. doi: 10.1088/1674-4926/37/3/034004

      Q F Zhao, Y Q Zhuang, J L Bao, W Hu. Radiation-induced 1/f noise degradation of bipolar linear voltage regulator[J]. J. Semicond., 2016, 37(3): 034004. doi: 10.1088/1674-4926/37/3/034004.
      Export: BibTex EndNote

      Radiation-induced 1/f noise degradation of bipolar linear voltage regulator

      doi: 10.1088/1674-4926/37/3/034004
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      Project supported by the National Natural Science Foundation of China(Nos.61076101, 61204092).

      More Information
      • Corresponding author: Bao Junlin, Email:baoing@126.com
      • Received Date: 2015-07-13
      • Accepted Date: 2015-09-04
      • Published Date: 2016-01-25

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