SEMICONDUCTOR MATERIALS

Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction

Yamei Wu, Ruixia Yang, Hanmin Tian and Shuai Chen

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 Corresponding author: Ruixia Yang, yangrx@hebut.edu.cn

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Abstract: Organic-inorganic hybrid perovskite CH3NH3PbI3 film is prepared on p-type silicon substrate using the one-step solution method to form a CH3NH3PbI3/p-Si heterojunction. The film morphology and structure are characterized by atomic force microscopy (AFM) and scanning electron microscopy (SEM). The photoelectric properties of the CH3NH3PbI3/p-Si heterojunction are studied by testing the current-voltage (I-V) with and without illumination and capacitance-voltage (C-V) characteristics. It turns out from the I-V curve without illumination that the CH3NH3PbI3/p-Si heterojunction has a rectifier feature with the rectification ratio over 70 at the bias of ± 5 V. Also, there appears a photoelectric conversion phenomenon on this heterojunction with a short circuit current (Im sc) of 0.16 μA and an open circuit voltage (Voc) of about 10 mV. The high frequency C-V characteristic of the Ag/CH3NH3PbI3/p-Si heterojunction turns out to be similar to that of the metal-insulator-semiconductor (MIS) structure, and a parallel translation of the C-V curve along the forward voltage axis is found. This parallel translation means the existence of defects at the CH3NH3PbI3/p-Si interface and positive fixed charges in the CH3NH3PbI3 layer. The defects at the interface of the CH3NH3PbI3/p-Si heterojunction result in the dramatic decline of the Voc. Besides, the C-V test of CH3NH3PbI3 film shows a non-linear dielectric property and the dielectric value is about 4.64 as calculated.

Key words: perovskite solar cellsheterojunctionCH3NH3PbI3/p-SiI-VC-V



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Fig. 1.  SEM and AFM morphology of CH3NH3PbI3 films on (a) FTO and (b) Si substrate.

Fig. 2.  Schematic diagrams of structure and physical photo of (a) Ag/CH3NH3PbI3/FTO and (b) Ag/CH3NH3PbI3/p-Si/Ag (scale bars,1 cm).

Fig. 3.  I-V characteristics of CH3NH3PbI3/p-Si heterojunction with and without illumination,the inset is the amplifying picture of the origin area.

Fig. 4.  I-V characteristic of Ag/CH3NH3PbI3/FTO structure.

Fig. 5.  Energy band diagrams of CH3NH3PbI3/p-Si heterojunction. (a) Before contact. (b) After contact.

Fig. 6.  C-V characteristics of fabricated samples. (a) Ag/CH3NH3PbI3/FTO. (b) Ag/CH3NH3PbI3/p-Si.

Table 1.   Short circuit current of CH3NH3PbI3/p-Si heterojunction samples

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    Received: 25 July 2015 Revised: Online: Published: 01 May 2016

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      Yamei Wu, Ruixia Yang, Hanmin Tian, Shuai Chen. Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction[J]. Journal of Semiconductors, 2016, 37(5): 053002. doi: 10.1088/1674-4926/37/5/053002 Y M Wu, R X Yang, H M Tian, S Chen. Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction[J]. J. Semicond., 2016, 37(5): 053002. doi: 10.1088/1674-4926/37/5/053002.Export: BibTex EndNote
      Citation:
      Yamei Wu, Ruixia Yang, Hanmin Tian, Shuai Chen. Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction[J]. Journal of Semiconductors, 2016, 37(5): 053002. doi: 10.1088/1674-4926/37/5/053002

      Y M Wu, R X Yang, H M Tian, S Chen. Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction[J]. J. Semicond., 2016, 37(5): 053002. doi: 10.1088/1674-4926/37/5/053002.
      Export: BibTex EndNote

      Photoelectric characteristics of CH3NH3PbI3/p-Si heterojunction

      doi: 10.1088/1674-4926/37/5/053002
      Funds:

      Project supported by the Hebei Province Natural Science Foundation of China (No. F2014202184) and the Tianjin Natural Science Foundation of China (No. 15JCZDJC37800).

      More Information
      • Corresponding author: yangrx@hebut.edu.cn
      • Received Date: 2015-07-25
      • Accepted Date: 2015-11-09
      • Published Date: 2016-01-25

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