J. Semicond. > 2008, Volume 29 > Issue 8 > 1540-1543

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Bulk Single Crystal Growth and Properties of In-Doped ZnO

Zhang Fan, Zhao Youwen, Dong Zhiyuan, Zhang Rui and Yang Jun

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Abstract: The Hall effect,XPS,optical absorption,Raman scattering,and cathode luminescence have been used to study the electrical properties,crystal quality,and defects of indium-doped bulk ZnO single crystals grown by the chemical vapor transport (CVT) method.Indium doped n-type ZnO single crystals with a carrier concentration of 1E18~1E19cm-3 have been obtained reproducibly by CVT.The doped indium exhibits high activation efficiency as a shallow donor in a ZnO single crystal.As doping concentration increases,the optical absorption and electrical properties of the In-ZnO change significantly.Defects and their influence on the In-ZnO single crystals have been analyzed.

Key words: zinc oxidedopingCVTsingle crystal

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    Received: 18 August 2015 Revised: 02 April 2008 Online: Published: 01 August 2008

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      Zhang Fan, Zhao Youwen, Dong Zhiyuan, Zhang Rui, Yang Jun. Bulk Single Crystal Growth and Properties of In-Doped ZnO[J]. Journal of Semiconductors, 2008, In Press. Zhang F, Zhao Y W, Dong Z Y, Zhang R, Yang J. Bulk Single Crystal Growth and Properties of In-Doped ZnO[J]. J. Semicond., 2008, 29(8): 1540.Export: BibTex EndNote
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      Zhang Fan, Zhao Youwen, Dong Zhiyuan, Zhang Rui, Yang Jun. Bulk Single Crystal Growth and Properties of In-Doped ZnO[J]. Journal of Semiconductors, 2008, In Press.

      Zhang F, Zhao Y W, Dong Z Y, Zhang R, Yang J. Bulk Single Crystal Growth and Properties of In-Doped ZnO[J]. J. Semicond., 2008, 29(8): 1540.
      Export: BibTex EndNote

      Bulk Single Crystal Growth and Properties of In-Doped ZnO

      • Received Date: 2015-08-18
      • Accepted Date: 2008-02-10
      • Revised Date: 2008-04-02
      • Published Date: 2008-08-02

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