| Citation: |
Feng Guoqiang, Ma Yingqi, Han Jianwei, Zhang Zhenlong, Huang Jianguo. Single Event Transients of Operational Amplifier and Optocoupler[J]. Journal of Semiconductors, 2008, In Press.
Feng G Q, Ma Y Q, Han J W, Zhang Z, Huang J G. Single Event Transients of Operational Amplifier and Optocoupler[J]. J. Semicond., 2008, 29(9): 1729.
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Single Event Transients of Operational Amplifier and Optocoupler
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Abstract
The single event transient effects of the operational amplifier LM124J and the optocoupler HCPL 5231 are investigated by a pulsed laser test facility.The relation of transient pulse shape to pulsed laser equivalent LET is tested,the sensitive areas of the SET effects are identified in voltage follower application mode of LM124J,and the mechanism is initially analyzed.The transient amplitude and duration of HCPL5231 at various equivalent LET are examined,and the SET cross-section is measured.The results of our test and heavy ion experimental data coincide closely,indicating that a pulsed laser test facility is a valid tool for single event effect evaluation. -
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