Chin. J. Semicond. > 1998, Volume 19 > Issue 1 > 61-65

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Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry

马文全 , 王玉田 , 庄岩 , 江德生 , 朱洪亮 , 张静媛 , 段俐宏 and 王圩

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1998

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      • Received Date: 2015-08-20

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