Chin. J. Semicond. > 1990, Volume 11 > Issue 1 > 55-62

CONTENTS

一种用于VLSI工艺模拟的反应离子刻蚀速率模型

冯向明 and 阮刚

PDF

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 2555 Times PDF downloads: 876 Times Cited by: 0 Times

    History

    Received: 19 August 2015 Revised: Online: Published: 01 January 1990

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote

      • Received Date: 2015-08-19

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return