Chin. J. Semicond. > 2007, Volume 28 > Issue 3 > 355-360

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Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer

Chen Wanjun, Zhang Bo and Li Zhaoji

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Abstract: A new design concept is proposed to eliminate the substrate-assisted depletion effect that significantly degrades the breakdown voltage (BV) of conventional super junction-LDMOS.The key feature of the new concept is that a partial buried layer is implemented which compensates for the charge interaction between the p-substrate and SJ region,realizing high breakdown voltage and low on-resistance.Numerical simulation results indicate that the proposed device features high breakdown voltage,low on-resistance,and reduced sensitivity to doping imbalance in the pillars.In addition,the proposed device is compatible with smart power technology.

Key words: super junctionLDMOSbreakdown voltagesubstrate-assisted depletion effect

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    Received: 18 August 2015 Revised: 23 October 2006 Online: Published: 01 March 2007

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      Chen Wanjun, Zhang Bo, Li Zhaoji. Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer[J]. Journal of Semiconductors, 2007, In Press. Chen W J, Zhang B, Li Z J. Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer[J]. Chin. J. Semicond., 2007, 28(3): 355.Export: BibTex EndNote
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      Chen Wanjun, Zhang Bo, Li Zhaoji. Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer[J]. Journal of Semiconductors, 2007, In Press.

      Chen W J, Zhang B, Li Z J. Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer[J]. Chin. J. Semicond., 2007, 28(3): 355.
      Export: BibTex EndNote

      Realizing High Breakdown Voltage SJ-LDMOS on Bulk Silicon Using a Partial n-Buried Layer

      • Received Date: 2015-08-18
      • Accepted Date: 2006-09-07
      • Revised Date: 2006-10-23
      • Published Date: 2007-03-06

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