Chin. J. Semicond. > 1996, Volume 17 > Issue 8 > 611-616
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亚表面齐纳基准二极管可靠性的1／f噪声预测方法

庄奕琪，孙青

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    Received: 18 August 2015 Revised: Online: Published: 01 August 1996

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      Article Navigation >  Journal of Semiconductors  > 1996  >  17(8): 611-616
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      • Received Date: 2015-08-18

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