Chin. J. Semicond. > 2006, Volume 27 > Issue 3 > 530-535

PAPERS

Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen

Yang Jingjing, He Xiukun, Cao Quanxi and Shi Yashen

PDF

Abstract: Electric parameters including resistivity,mobility,and free carrier concentration are measured at low temperatures for n-type 6H-SiC from China and Cree corporation.Their impurity concentration and levels are obtained from the fitting data of FCCS.The experimental results show that the concentration and compensation level of the impurity greatly affect the electric properties of SiC at low temperatures.The two different levels of nitrogen donor work together for 6H-SiC with a low compensation,but the accepter levels work at low temperatures for 6H-SiC with a high compensation.The peak of the mobility curve of the latter decreases and moves to the right as temperature increases.At the same time,the highly compensated SiC is transformed from n-type to p-type at low temperatures,which is analyzed theoretically.

Key words: free carrier concentrationFCCSdonoracceptercompensation leveldistribution function

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 3584 Times PDF downloads: 2623 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 March 2006

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Yang Jingjing, He Xiukun, Cao Quanxi, Shi Yashen. Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen[J]. Journal of Semiconductors, 2006, In Press. Yang J J, He X K, Cao Q X, Shi Y S. Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen[J]. Chin. J. Semicond., 2006, 27(3): 530.Export: BibTex EndNote
      Citation:
      Yang Jingjing, He Xiukun, Cao Quanxi, Shi Yashen. Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen[J]. Journal of Semiconductors, 2006, In Press.

      Yang J J, He X K, Cao Q X, Shi Y S. Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen[J]. Chin. J. Semicond., 2006, 27(3): 530.
      Export: BibTex EndNote

      Resistivity,Mobility,and Free Carrier Concentration of 6H-SiC Crystal Doped by Nitrogen

      • Received Date: 2015-08-20

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return