Chin. J. Semicond. > 2004, Volume 25 > Issue 5 > 562-567
|

CONTENTS

施主型界面态引起深亚微米槽栅PMOS特性的退化

任红霞 , 张晓菊 and 郝跃

+ Author Affiliations

PDF

Key words: 槽栅PMOSFET, 施主界面态密度, 栅极特性, 漏极电流驱动能力, 特性退化

    • Search

    Advanced Search >>

    Article Metrics

    Article views: 2278 Times PDF downloads: 856 Times Cited by: 0 Times

    History

    Received: 19 August 2015 Revised: Online: Published: 01 May 2004

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2004  >  25(5): 562-567
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote
      shu

      • Received Date: 2015-08-19

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return