Chin. J. Semicond. > 2005, Volume 26 > Issue 2 > 254-257

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Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating

Li Jian, An Junming, Wang Hongjie, Xia Junlei and Hu Xiongwei

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 Corresponding author: Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

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Abstract: A novel design of 100GHz-spaced 16channel arrayed-waveguide grating (AWG) based on silica-on-silicon chip is reported.AWG is achieved by adding a Y-branch to the AWG and arranging the input/output channel in a neat row, so the whole configuration can be aligned and packaged using only one fiber-array. This configuration can decrease the device’s size, enlarge the minimum radius of curvature, save time on polishing and alignment, and reduce the chip’s fabrication cost.

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    Received: 19 August 2015 Revised: Online: Published: 01 February 2005

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      Li Jian, An Junming, Wang Hongjie, Xia Junlei, Hu Xiongwei. Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating[J]. Journal of Semiconductors, 2005, In Press. Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating[J]. Chin. J. Semicond., 2005, 26(2): 254.Export: BibTex EndNote
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      Li Jian, An Junming, Wang Hongjie, Xia Junlei, Hu Xiongwei. Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating[J]. Journal of Semiconductors, 2005, In Press.

      Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating[J]. Chin. J. Semicond., 2005, 26(2): 254.
      Export: BibTex EndNote

      Design, Fabrication, and Testing of Single-Side Alignment of 16×0.8nm Arrayed Waveguide Grating

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      • Corresponding author: Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
      • Received Date: 2015-08-19

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