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王刘坤 , Twan Bearda , Karine Kenis , Sophia Arnauts , Patrick Van Doorne , 陈寿面 , Paul Mertens and Marc Heyns
Key words: 栅氧完整性, 金属沾污, 本征电荷击穿, 斜坡电流应力, MOS电容器
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Received: 19 August 2015 Revised: Online: Published: 01 May 2004
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