Chin. J. Semicond. > 2001, Volume 22 > Issue 6 > 726-728

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Key words: SiC, 纳米材料, 喇曼光谱, Fro¨hlich相互作用

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    Received: 20 August 2015 Revised: Online: Published: 01 June 2001

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      • Received Date: 2015-08-20

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