Chin. J. Semicond. > 2000, Volume 21 > Issue 8 > 778-785
|

CONTENTS

用弹道电子发射显微术研究超薄金属硅化物/硅肖特基接触

茹国平 , 屈新萍 , 竺士炀 and 李炳宗

+ Author Affiliations

PDF

Key words: 肖特基势垒, 弹道电子显微术, 硅化物, 离子轰击

    • Search

    Advanced Search >>

    Article Metrics

    Article views: 2377 Times PDF downloads: 1128 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 August 2000

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2000  >  21(8): 778-785
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return