Chin. J. Semicond. > 2000, Volume 21 > Issue 12 > 1145-1151

CONTENTS

Numerical Analysis of Characterized Back Interface Traps of SOI Devices by R-G Current

何进 , 黄如 , 张兴 , 黄爱华 , 孙飞 and 王阳元

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Key words: SOI

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    History

    Received: 20 August 2015 Revised: Online: Published: 01 December 2000

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      • Received Date: 2015-08-20

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