Chin. J. Semicond. > 2002, Volume 23 > Issue 11 > 1211-1216

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Key words: MOSFET, ESD, 潜在损伤, 1/f噪声, 检测方法

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    Received: 19 August 2015 Revised: Online: Published: 01 November 2002

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      • Received Date: 2015-08-19

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