Chin. J. Semicond. > 1980, Volume 1 > Issue 4 > 329-332

CONTENTS

大规模集成电路测试图案产生方法的研究,

林雨

PDF

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 2110 Times PDF downloads: 930 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 April 1980

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote

      • Received Date: 2015-08-20

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return