Chin. J. Semicond. > 2006, Volume 27 > Issue S1 > 314-317

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Electrical Shock Effects on MCT Long-Wavelength PC Detectors

Liu Dafu, Wu Ligang, Xu Guosen, Zhang Lianmei, Jin Xiufang and Gong Haimei

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Abstract: This study is concerned with electrical shock effect on performance of the n-type HgCdTe photoconductive detector with a composition of x≈0.2 in order to improve the reliability under this certain situation.An electrical shock was applied on long wavelength PC MCT detectors.Before and after the shock the resistance,response spectra,blackbody signal and minority carrier lifetime of detectors were measured at normal conditions.Experimental results show that short time shock has no obvious effects on detector performance and the composition have a tendency of decrease.When shock time increase the composition have a tendency of increase,and the detectors performance are decreasing,even wear out.Analysis proves the effect of electrical shock mainly is Joule heat,which is similar to laser irradiation effects

Key words: electrical shock MCT PC detectors response spectra minority carrier lifetime

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2006

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      Liu Dafu, Wu Ligang, Xu Guosen, Zhang Lianmei, Jin Xiufang, Gong Haimei. Electrical Shock Effects on MCT Long-Wavelength PC Detectors[J]. Journal of Semiconductors, 2006, In Press. Liu D F, Wu L G, Xu G S, Zhang L M, Jin X F, Gong H M. Electrical Shock Effects on MCT Long-Wavelength PC Detectors[J]. Chin. J. Semicond., 2006, 27(13): 314.Export: BibTex EndNote
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      Liu Dafu, Wu Ligang, Xu Guosen, Zhang Lianmei, Jin Xiufang, Gong Haimei. Electrical Shock Effects on MCT Long-Wavelength PC Detectors[J]. Journal of Semiconductors, 2006, In Press.

      Liu D F, Wu L G, Xu G S, Zhang L M, Jin X F, Gong H M. Electrical Shock Effects on MCT Long-Wavelength PC Detectors[J]. Chin. J. Semicond., 2006, 27(13): 314.
      Export: BibTex EndNote

      Electrical Shock Effects on MCT Long-Wavelength PC Detectors

      • Received Date: 2015-08-20

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