Chin. J. Semicond. > 2002, Volume 23 > Issue 3 > 296-300

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复合栅控二极管新技术提取热载流子诱生的NMOS/SOI器件界面陷阱的横向分布

何进 , 张兴 , 黄如 and 王阳元

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Key words: SOI技术, MOS器件, 界面陷阱分布, 热载流子效应, 复合栅控二极管技术

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    Received: 19 August 2015 Revised: Online: Published: 01 March 2002

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      • Received Date: 2015-08-19

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