Chin. J. Semicond. > 2005, Volume 26 > Issue 1 > 133-137

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刻蚀衍射光栅解复用器的偏振色散分析

庞冬青 , 宋军 and 何赛灵

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Abstract: 介绍了一种将矩量法应用于刻蚀衍射光栅解复用器设计分析的偏振敏感型方法.通过数值分析,证明提供的方法在分析器件色散响应方面比传统的标量方法更加接近实测结果.分析了器件的偏振独立损耗和偏振色散差随入射角和衍射级的变化关系,指出器件结构参数的确定应以满足偏振色散差的实际需要为主,而在考查通道均匀性方面则应该着重考虑结构参数对偏振独立损耗特性的影响.

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    Received: 19 August 2015 Revised: Online: Published: 01 January 2005

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      刻蚀衍射光栅解复用器的偏振色散分析[J]. Journal of Semiconductors, 2005, In Press. 刻蚀衍射光栅解复用器的偏振色散分析[J]. Chin. J. Semicond., 2005, 26(1): 133.Export: BibTex EndNote
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      刻蚀衍射光栅解复用器的偏振色散分析[J]. Journal of Semiconductors, 2005, In Press.

      刻蚀衍射光栅解复用器的偏振色散分析[J]. Chin. J. Semicond., 2005, 26(1): 133.
      Export: BibTex EndNote

      刻蚀衍射光栅解复用器的偏振色散分析

      • Received Date: 2015-08-19

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