Chin. J. Semicond. > 2003, Volume 24 > Issue S1 > 183-186
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Sensor Used in Micro-Tomography and Its Signal processing

Wei Biao, Mi Deling, Yu Yu and Pan Yingjun

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Abstract: A novel sensor used in pCT(micro-computed tomography) is studied. Mathematical methods for follow the tracks ofenergy and geometry are used as signal processing while imaging, accounting for problem of center of brightness With circle eXisted in linear array scanning by means ofarea array CCD to be used as sensor in pCT. This new sensor has such some properties as high space resolution, structure of flexibility, high efficiency with light transmitted and light coupled, etc. This new sensor can be applied in micro-computed tomography.

Key words: micro-computed tomography ( pCT) ,  area array CCD,  linear array scanning,  center of brightness With circle

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    Received: 16 March 2016 Revised: Online: Published: 01 January 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(S1): 183-186
      Wei Biao, Mi Deling, Yu Yu, Pan Yingjun. Sensor Used in Micro-Tomography and Its Signal processing[J]. Journal of Semiconductors, 2003, In Press. Wei B, Mi D L, Yu Y, Pan Y J. Sensor Used in Micro-Tomography and Its Signal processing[J]. Chin. J. Semicond., 2003, 24(S1): 183.Export: BibTex EndNote
      Citation:
      Wei Biao, Mi Deling, Yu Yu, Pan Yingjun. Sensor Used in Micro-Tomography and Its Signal processing[J]. Journal of Semiconductors, 2003, In Press.

      Wei B, Mi D L, Yu Y, Pan Y J. Sensor Used in Micro-Tomography and Its Signal processing[J]. Chin. J. Semicond., 2003, 24(S1): 183.
      Export: BibTex EndNote
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      Sensor Used in Micro-Tomography and Its Signal processing

      • The Key Laboratory for Optoelectronic Technology and Systems of Ministry of Education, Chongqing University, Chongqing 400044, China,The Key Laboratory for Optoelectronic Technology and Systems of Ministry of Education, Chongqing University, Chongqing 400044, China,The Key Laboratory for Optoelectronic Technology and Systems of Ministry of Education, Chongqing University, Chongqing 400044, China and The Key Laboratory for Optoelectronic Technology and Systems of Ministry of Education, Chongqing University, Chongqing 400044, China

      • Received Date: 2016-03-16
      • Published Date: 2016-03-15

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