Chin. J. Semicond. > 2005, Volume 26 > Issue 6 > 1259-1263
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IC参数成品率全局优化的映射距离最小化算法

荆明娥 , 李康 , 王俊平 and 郝跃

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Key words: 参数成品率, 映射距离, 均匀设计, k近邻密度估计

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    Received: 19 August 2015 Revised: Online: Published: 01 June 2005

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      Article Navigation >  Journal of Semiconductors  > 2005  >  26(6): 1259-1263
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      • Received Date: 2015-08-19

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