Chin. J. Semicond. > 1980, Volume 1 > Issue 1 > 37-42

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一种显示N~+-GaAs多种缺陷的阳极腐蚀法

曹福年

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1980

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      • Received Date: 2015-08-20

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