Chin. J. Semicond. > 1987, Volume 8 > Issue 5 > 545-547

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B~+和P~+离子注入在n-Si中产生缺陷能级的进一步研究

孙璟兰 , 陈建新 and 李名复

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    Received: 19 August 2015 Revised: Online: Published: 01 May 1987

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      • Received Date: 2015-08-19

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