| Citation: |
Luo Weijun, Chen Xiaojuan, Liu Guoguo, Liu Xinyu, Wang Xiaoyan, Fang Cebao, Guo Lunchun, Wang Xiaoliang. A Test Circuit with Microstrip Filter for Microwave Power Device[J]. Journal of Semiconductors, 2007, In Press.
Luo W J, Chen X J, Liu G G, Liu X Y, Wang X Y, Fang C B, Guo L C, Wang X L. A Test Circuit with Microstrip Filter for Microwave Power Device[J]. Chin. J. Semicond., 2007, 28(S1): 58.
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A Test Circuit with Microstrip Filter for Microwave Power Device
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Abstract
With the principles of microwave circuits and semiconductor device physics，three kinds of microwave power device test circuits are designed and simulated，whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8GHz.The simulated results verify that the test circuit with stepped-impedance filter bias network has a larger bandwidth than that with the radial stub.A microstrip interdigital capacitor is used in the third test circuit to replace the DC block，however，which does not show its advantage during the test frequency band.Based on the simulated results，the stepped.impedance filter test circuit can be used to evaluate microwave power devices in the whole C band，namely from 4 to 8GHz.-
Keywords:
- filter,
- radial stub,
- test circuit,
- stepped-impedance
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References
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Proportional views
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