Chin. J. Semicond. > 1992, Volume 13 > Issue 5 > 293-301

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关于薄SiO_2的高场弛豫电导与击穿机制的研究

许铭真 , 谭长华 and 王阳元

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    Received: 19 August 2015 Revised: Online: Published: 01 May 1992

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      • Received Date: 2015-08-19

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