Chin. J. Semicond. > 2004, Volume 25 > Issue 4 > 436-440

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HALO结构pMOSFETs在V_g=V_d/2应力模式下应力相关的热载流子退化

胡靖 , 赵要 , 许铭真 and 谭长华

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Key words: 热载流子, 一次碰撞电离, 二次碰撞电离, 复合

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    Received: 19 August 2015 Revised: Online: Published: 01 April 2004

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      • Received Date: 2015-08-19

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