Chin. J. Semicond. > 2003, Volume 24 > Issue 2 > 168-172

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Key words: GaAs/AlAs异质结, Si夹层, XPS测量, C-V测量, DLTS测量, 带阶调节

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    Received: 20 August 2015 Revised: Online: Published: 01 February 2003

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      • Received Date: 2015-08-20

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