Chin. J. Semicond. > 2002, Volume 23 > Issue 10 > 1112-1115
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基于核的信息安全处理芯片可测性设计

陆思安 , 何剑春 , 严晓浪 and 何乐年

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Key words: 可测性设计, 基于核设计, 测试总线, 芯片测试控制器

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    Received: 19 August 2015 Revised: Online: Published: 01 October 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(10): 1112-1115
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      • Received Date: 2015-08-19

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