Chin. J. Semicond. > 2001, Volume 22 > Issue 12 > 1565-1571

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Key words: PT-IGBT, NPT-IGBT, 通态压降, 关断损耗

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2001

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      • Received Date: 2015-08-20

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