Chin. J. Semicond. > 2000, Volume 21 > Issue 11 > 1111-1115

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Key words: 超高真空化学气相淀积, SiGe, Raman散射, 俄歇电子能谱, X射线双晶衍射

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    Received: 20 August 2015 Revised: Online: Published: 01 November 2000

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      • Received Date: 2015-08-20

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