J. Semicond. > 2008, Volume 29 > Issue 1 > 149-152

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A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation

Liu Jie, Zhou Jicheng, Luo Hongwei, Kong Xuedong, En Yunfei, Shi Qian, He Yujuan and Lin Li

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Abstract: Total dose irradiation effects of partially depleted SOI MOSFETs are studied under 10keV X-ray exposure.Results show that the front-gate characteristics do not change significantly during irradiation.An anomalous kink is observed in the back-gate logarithmic curve of both nMOS and pMOS,which is attributed to charged traps at the buried oxide/top silicon (BOX/SOI) interface during irradiation.Two-dimensional numerical simulation using MEDICI supports this conclusion.

Key words: X-raySOI MOSFETspartially depletedkink effecttotal-dose irradiation

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    Received: 18 August 2015 Revised: 13 August 2007 Online: Published: 01 January 2008

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      Liu Jie, Zhou Jicheng, Luo Hongwei, Kong Xuedong, En Yunfei, Shi Qian, He Yujuan, Lin Li. A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation[J]. Journal of Semiconductors, 2008, In Press. Liu J, Zhou J C, Luo H W, Kong X D, En Y F, Shi Q, He Y J, Lin L. A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation[J]. J. Semicond., 2008, 29(1): 149.Export: BibTex EndNote
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      Liu Jie, Zhou Jicheng, Luo Hongwei, Kong Xuedong, En Yunfei, Shi Qian, He Yujuan, Lin Li. A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation[J]. Journal of Semiconductors, 2008, In Press.

      Liu J, Zhou J C, Luo H W, Kong X D, En Y F, Shi Q, He Y J, Lin L. A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation[J]. J. Semicond., 2008, 29(1): 149.
      Export: BibTex EndNote

      A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation

      • Received Date: 2015-08-18
      • Accepted Date: 2007-06-17
      • Revised Date: 2007-08-13
      • Published Date: 2007-12-26

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