Chin. J. Semicond. > 2001, Volume 22 > Issue 4 > 440-445

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Key words: 加压布里奇曼法, HgCdTe晶体, 二次配料工艺, 晶体结构完整性, 组分均匀性

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    Received: 20 August 2015 Revised: Online: Published: 01 April 2001

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      • Received Date: 2015-08-20

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