SEMICONDUCTOR DEVICES

Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs

Zhou Shouli, Xiong Deping and Qin Yali

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Abstract: Heavy doping of the base in HBTs brings about a bandgap narrowing (BGN) effect, which modifies the intrinsic carrier density and disturbs the band offset, and thus leads to the change of the currents. Based on a thermionic-field-diffusion model that is used to the analyze the performance of an abrupt HBT with a heavy-doped base, the conclusion is made that, although the BGN effect makes the currents obviously change due to the modification of the intrinsic carrier density, the band offsets disturbed by the BGN effect should also be taken into account in the analysis of the electrical characteristics of abrupt HBTs. In addition, the BGN effect changes the bias voltage for the onset of Kirk effects.

Key words: HBTs bandgap narrowing intrinsic carrier density band offsets Kirk effects

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    Received: 18 August 2015 Revised: 15 December 2008 Online: Published: 01 April 2009

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      Zhou Shouli, Xiong Deping, Qin Yali. Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs[J]. Journal of Semiconductors, 2009, 30(4): 044003. doi: 10.1088/1674-4926/30/4/044003 Zhou S L, Xiong D P, Qin Y L. Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs[J]. J. Semicond., 2009, 30(4): 044003. doi: 10.1088/1674-4926/30/4/044003.Export: BibTex EndNote
      Citation:
      Zhou Shouli, Xiong Deping, Qin Yali. Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs[J]. Journal of Semiconductors, 2009, 30(4): 044003. doi: 10.1088/1674-4926/30/4/044003

      Zhou S L, Xiong D P, Qin Y L. Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs[J]. J. Semicond., 2009, 30(4): 044003. doi: 10.1088/1674-4926/30/4/044003.
      Export: BibTex EndNote

      Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs

      doi: 10.1088/1674-4926/30/4/044003
      • Received Date: 2015-08-18
      • Accepted Date: 2008-11-21
      • Revised Date: 2008-12-15
      • Published Date: 2009-04-07

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