SEMICONDUCTOR TECHNOLOGY

An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging

Zhang Lucheng, Xu Xinxiang, Yang Zhuojian, Sun Xiaopu, Xu Hongyun, Liu Haobin and Shen Hui

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Abstract: In order to monitor the fabrication process, an infrared imaging system was established to detect the shunted regions in crystalline silicon solar cells. The temperature of the shunted region was obviously higher than that of the non-shunted region when the cell was biased under direct voltage due to the Joule heat effect, and the shunted region could be detected by infrared imaging. The shunts caused by seven different reasons can be identified using metallurgical microscopy, scanning electron microscopy, and energy dispersive X-ray spectroscopy. Approaches for diminishing shunts are presented. The methods are beneficial for the optimization of the cell fabrication processes and the improvement of the cell performances.

Key words: silicon solar cell shunt infrared imaging

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    Received: 18 August 2015 Revised: 16 April 2009 Online: Published: 01 July 2009

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      Zhang Lucheng, Xu Xinxiang, Yang Zhuojian, Sun Xiaopu, Xu Hongyun, Liu Haobin, Shen Hui. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. Journal of Semiconductors, 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001 Zhang L C, Xu X X, Yang Z J, Sun X P, Xu H Y, Liu H B, Shen H. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. J. Semicond., 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001.Export: BibTex EndNote
      Citation:
      Zhang Lucheng, Xu Xinxiang, Yang Zhuojian, Sun Xiaopu, Xu Hongyun, Liu Haobin, Shen Hui. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. Journal of Semiconductors, 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001

      Zhang L C, Xu X X, Yang Z J, Sun X P, Xu H Y, Liu H B, Shen H. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. J. Semicond., 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001.
      Export: BibTex EndNote

      An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging

      doi: 10.1088/1674-4926/30/7/076001
      • Received Date: 2015-08-18
      • Accepted Date: 2009-04-07
      • Revised Date: 2009-04-16
      • Published Date: 2009-07-10

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