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An improved analytical model for the electric field distribution in an RF-LDMOST structure

Jiang Yibo, Wang Shuai, Li Ke, Chen Lei and Du Huan

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Abstract: This paper presents an improved analytical model for an RF-LDMOST structure based on the 2D Poisson equation. The derived model indicates the influence of high doped shallow drift and low doping concentration p epitaxial layer on the electric field distribution. In particular, the importance of the thickness of the p epitaxial layer for electric field distributions in RF-LDMOST are shown through MATLAB analytical results based on the model. Then ISE TCAD simulations and experiments are processed and their results are in agreement with the analytical model. This model contributes to the comprehension and optimization design of RF-LDMOST.

Key words: RF-LDMOST

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    Received: 18 August 2015 Revised: 20 August 2010 Online: Published: 01 December 2010

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      Jiang Yibo, Wang Shuai, Li Ke, Chen Lei, Du Huan. An improved analytical model for the electric field distribution in an RF-LDMOST structure[J]. Journal of Semiconductors, 2010, 31(12): 124008. doi: 10.1088/1674-4926/31/12/124008 Jiang Y B, Wang S, Li K, Chen L, Du H. An improved analytical model for the electric field distribution in an RF-LDMOST structure[J]. J. Semicond., 2010, 31(12): 124008. doi: 10.1088/1674-4926/31/12/124008.Export: BibTex EndNote
      Citation:
      Jiang Yibo, Wang Shuai, Li Ke, Chen Lei, Du Huan. An improved analytical model for the electric field distribution in an RF-LDMOST structure[J]. Journal of Semiconductors, 2010, 31(12): 124008. doi: 10.1088/1674-4926/31/12/124008

      Jiang Y B, Wang S, Li K, Chen L, Du H. An improved analytical model for the electric field distribution in an RF-LDMOST structure[J]. J. Semicond., 2010, 31(12): 124008. doi: 10.1088/1674-4926/31/12/124008.
      Export: BibTex EndNote

      An improved analytical model for the electric field distribution in an RF-LDMOST structure

      doi: 10.1088/1674-4926/31/12/124008
      • Received Date: 2015-08-18
      • Accepted Date: 2010-06-25
      • Revised Date: 2010-08-20
      • Published Date: 2010-11-25

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