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An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process

Liu Ming, Chen Hong, Li Changmeng and Wang Zhihua

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Abstract: This paper presents a 1 kb sub-threshold SRAM in the 180 nm CMOS process based on an improved 11T SRAM cell with new structure. Final test results verify the function of the SRAM. The minimal operating voltage of the chip is 350 mV, where the speed is 165 kHz, the leakage power is 42 nW and the dynamic power is about 200 nW. The designed SRAM can be used in ultra-low-power SoC.

Key words: sub-threshold SRAM

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    Received: 18 August 2015 Revised: 05 February 2010 Online: Published: 01 June 2010

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      Liu Ming, Chen Hong, Li Changmeng, Wang Zhihua. An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process[J]. Journal of Semiconductors, 2010, 31(6): 065013. doi: 10.1088/1674-4926/31/6/065013 Liu M, Chen H, Li C M, Wang Z H. An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process[J]. J. Semicond., 2010, 31(6): 065013. doi: 10.1088/1674-4926/31/6/065013.Export: BibTex EndNote
      Citation:
      Liu Ming, Chen Hong, Li Changmeng, Wang Zhihua. An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process[J]. Journal of Semiconductors, 2010, 31(6): 065013. doi: 10.1088/1674-4926/31/6/065013

      Liu M, Chen H, Li C M, Wang Z H. An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process[J]. J. Semicond., 2010, 31(6): 065013. doi: 10.1088/1674-4926/31/6/065013.
      Export: BibTex EndNote

      An ultra-low-power 1 kb sub-threshold SRAM in the 180 nm CMOS process

      doi: 10.1088/1674-4926/31/6/065013
      • Received Date: 2015-08-18
      • Accepted Date: 2009-11-16
      • Revised Date: 2010-02-05
      • Published Date: 2010-06-03

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